The Phenom SEM is a Desktop SEM that provides high resolution imaging in a quick and easy to use format. An SEM is a type of electron microscope that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample’s surface topography and composition.

The FEI Phenom SEM uses Backscattered electrons (BSE) for image detection. BSE consist of high-energy electrons originating in the electron beam, that are reflected or back-scattered out of the specimen interaction volume by elastic scattering interactions with specimen atoms. Since heavy elements (high atomic number) backscatter electrons more strongly than light elements (low atomic number) they appear brighter in the image. BSE are used to detect contrast between areas with different chemical compositions.

Technical Specifications                                   

Digital image detection
             Light optical – Colour CCD
Electron optical
             High Sensitivity Backscatter Electron
             Detector

Compositional and Topographical mode 
Sample size:
              25 mm (diameter) x 30 mm (h)
Sample loading time 
              Light optical:  < 5s
              Electron optical: < 30s
Sample stage - Computer controlled motorized X  and Y

Control:
             Touch screen monitor 
             Rotary Mag. knob 
             USB 2.0 flash drive
 Illumination Light optical:
              Selectable axial and off-axis LEDs 
Illumination Electron optical
              Long lifetime thermionic source

Phenom SEM in NCLA

Image of polymer microspheres on a silicon surface (particles are approximately 8 µm in diameter)

Image of Poly NIPAM (N-isopropylacrylamide) produced in Supercritical CO₂