NCLA

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Overview of Measurement & Characterisation EQuiPMENT

The NCLA facility contains a wide range of equipment for measurement, material characterisation, and process control & analysis.

This equipment is available to access on a contract and collaborative basis. Please contact nclanuigalway.ie with details of your requirements.

Measurement

Optical Surface Profilometer Desktop Scanning Electron Microscope (SEM) Atomic Force Microscope (AFM) Confocal Raman & Spectral Emission Microscope Optical Microscopes (Brightfield, Dark Field, DIC) Thin Film Measurement

Process Control & Analysis
Infra-Red (IR) Thermography Camera High Speed Imaging (up to 500k fps) Metallurgical Sectioning & Polishing

This page was last updated Monday, June 20, 2011